Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time
نویسندگان
چکیده
منابع مشابه
Selective scan slice repetition for simultaneous reduction of test power consumption and test data volume
In this paper, we present a selective scan slice encoding technique for power-aware test data compression. The proposed scheme dramatically reduces test data volume via scan slice repetition, and generates an adjacent-filled test pattern known as the favorable lowpower pattern mapping method. Experiments were performed on the large ITC’99 benchmark circuits, and results show the effectiveness o...
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∗ Research of H. Tang and S. M. Reddy supported in part by NSF Grant No. CCR-0097005 and by SRC Grant No. 2001-TJ-949. Research of I. Pomeranz supported in part by NSF Grant No. CCR-0098091 and by SRC Grant No. 2001-TJ-950. Abstract We propose a new method for reducing test data volume and test application time in scan designs with multiple scan chains. The method uses a reconfigurable switch t...
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ژورنال
عنوان ژورنال: IEICE Transactions on Information and Systems
سال: 2009
ISSN: 0916-8532,1745-1361
DOI: 10.1587/transinf.e92.d.1462